Atomic force microscopy

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several applications, including visualizing dynamic cellular and molecular processes and quantifying cellular binding forces and adhesion. 

In this In Focus, sponsored by Bruker BioAFM (Berlin, Germany), we provide an introduction to AFM, including how it works, the technical aspects to consider when utilizing this technology in the lab and its wide range of applications.